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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Reliability-Aware Optimization for DVS-Enabled Real-Time Embedded Systems

✍ Scribed by Dabiri, Foad; Amini, Navid; Rofouei, Mahsan; Sarrafzadeh, Majid

Book ID: 120535443
Publisher: IEEE
Year: 2008
Weight: 307 KB
Category: Article
ISBN: 0769531172
DOI: 10.1109/ISQED.2008.4479837

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