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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - An On-Demand Test Triggering Mechanism for NoC-Based Safety-Critical Systems

✍ Scribed by Lee, Jason D.; Gupta, Nikhil; Bhojwani, Praveen S.; Mahapatra, Rabi N.

Book ID: 115541720
Publisher: IEEE
Year: 2008
Weight: 373 KB
Volume: 0
Category: Article
ISBN: 0769531172
DOI: 10.1109/isqed.2008.4479723

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