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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Strain influence on analog performance of single-gate and FinFET SOI nMOSFETs

✍ Scribed by Martino, Joao Antonio; Pavanello, Marcelo Antonio; Simoen, Eddy; Claeys, Cor

Book ID: 120941913
Publisher: IEEE
Year: 2008
Weight: 864 KB
Category: Article
ISBN: 1424421853
DOI: 10.1109/ICSICT.2008.4734477

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