𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - An embedded system for real-time traffic sign recognizing

✍ Scribed by Souki, M. A.; Boussaid, L.; Abid, M.

Book ID: 125500375
Publisher: IEEE
Year: 2008
Weight: 240 KB
Category: Article
ISBN: 1424434793
DOI: 10.1109/IDT.2008.4802512

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2008 3rd International Design and

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Universal test set for bridging fault detection in reversible circuit

✍ Sarkar, Pradyut; Chakrabarti, Susanta 📂 Article 📅 2008 🏛 IEEE ⚖ 189 KB

[IEEE 2008 3rd International Design and

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - A model driven engineering based method for scheduling analysis

✍ kacem, Yessine Hadj; Mahfoudhi, Adel; Karamti, Walid; Abid, Mohamed 📂 Article 📅 2008 🏛 IEEE ⚖ 227 KB

[IEEE 2008 3rd International Design and

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - System level design of radio frequency receiver for IEEE 802.16 standard

✍ Ayadi, Dorra; Rodriguez, Saul; Loulou, Mourad; Ismail, Mohammed 📂 Article 📅 2008 🏛 IEEE ⚖ 190 KB

[IEEE 2008 3rd International Design and

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - Low-power flexible GF(p) elliptic-curve cryptography processor

✍ Ahmadi, Hamid Reza; Afzali-Kusha, Ali 📂 Article 📅 2008 🏛 IEEE ⚖ 225 KB

[IEEE 2008 3rd International Design and

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - New tunable coplanar microwave phase shifter with nematic crystal liquid

✍ Sahbani, Fehim; Tentillier, N.; Gharsallah, A.; Gharbi, A.; Legrand, C. 📂 Article 📅 2008 🏛 IEEE ⚖ 328 KB

[IEEE 2008 3rd International Design and

[IEEE 2008 3rd International Design and Test Workshop (IDT) - Monastir, Tunisia (2008.12.20-2008.12.22)] 2008 3rd International Design and Test Workshop - A novel fault tolerant design and an algorithm for tolerating faults in digital circuits

✍ Kshirsagar, R.V.; Patrikar, R.M. 📂 Article 📅 2008 🏛 IEEE ⚖ 190 KB