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[IEEE 2008 26th International Conference on Microelectronics (MIEL 2008) - Nis, Serbia and Montenegro (2008.05.11-2008.05.14)] 2008 26th International Conference on Microelectronics - RF power LDMOSFET characterization and modeling for reliability issues: DC and RF performances

✍ Scribed by Chetibi, M.; Gares, M.; Masmoudi, M.; Maanane, H.; Marcon, J.; Mourgues, K.; Eudeline, Ph.

Book ID: 125804513
Publisher: IEEE
Year: 2008
Weight: 612 KB
Category: Article
ISBN: 142441881X
DOI: 10.1109/ICMEL.2008.4559250

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