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[IEEE 2007 International Workshop on Physics of Semiconductor Devices - Mumbai, India (2007.12.16-2007.12.20)] 2007 International Workshop on Physics of Semiconductor Devices - Radiation effects on strain-engineered p-MOSFETs

✍ Scribed by Maiti, T. K.; Mahato, S .S.; Chakraborty, P.; Sarkar, S. K.; Maiti, C. K.

Book ID: 126669991
Publisher: IEEE
Year: 2007
Weight: 280 KB
Category: Article
ISBN: 1424417287
DOI: 10.1109/IWPSD.2007.4472478

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