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[IEEE 2007 International Workshop on Physics of Semiconductor Devices - Mumbai, India (2007.12.16-2007.12.20)] 2007 International Workshop on Physics of Semiconductor Devices - Quality assessment of CdZnTe (Zn ∼ 4 %) crystals

✍ Scribed by Kulkarni, Gururaj A.; Koteswara Rao, K. S. R.; Raman, R.; Pandey, Akhilesh; Sharma, R. K.; Garg, A. K.; Srivastava, Meenakshi

Book ID: 125511490
Publisher: IEEE
Year: 2007
Weight: 192 KB
Category: Article
ISBN: 1424417287
DOI: 10.1109/IWPSD.2007.4472547

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