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[IEEE 2007 International Workshop on Physics of Semiconductor Devices - Mumbai, India (2007.12.16-2007.12.20)] 2007 International Workshop on Physics of Semiconductor Devices - SEM investigations of the surface and cross-section features of ZnO NWs under FIB treatment

✍ Scribed by Shmavonyan, G. Sh.

Book ID: 126290383
Publisher: IEEE
Year: 2007
Weight: 263 KB
Category: Article
ISBN: 1424417287
DOI: 10.1109/IWPSD.2007.4472527

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