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[IEEE 2007 International Workshop on Electron Devices and Semiconductor Technology (EDST) - Tsinghua University (2007.06.3-2007.06.4)] 2007 International Workshop on Electron Devices and Semiconductor Technology (EDST) - A Support Vector Regression Nonlinear Model for SiC MESFET

✍ Scribed by Guo, Yunchuan; Xu, Yuehang; Xu, Ruimin; Yan, Bo

Book ID: 120941658
Publisher: IEEE
Year: 2007
Weight: 199 KB
Category: Article
ISBN-13: 9781424410989
DOI: 10.1109/EDST.2007.4289800

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