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[IEEE 2007 International Semiconductor Device Research Symposium - College Park, MD, USA (2007.12.12-2007.12.14)] 2007 International Semiconductor Device Research Symposium - Advanced rad hard SRAM development and hardware test results

✍ Scribed by Doyle, Scott; Hoang, Tri; Ross, Jason; Haddad, Nadim; Lawrence, Reed; Chan, Ernie

Book ID: 120553218
Publisher: IEEE
Year: 2007
Weight: 240 KB
Category: Article
ISBN: 1424418925
DOI: 10.1109/ISDRS.2007.4422259

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