𝔖 Bobbio Scriptorium

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[IEEE 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Rabat, Morocco (2007.09.2-2007.09.5)] 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - An efficient model to evaluate the impact of design parameters on charge pump circuits’ performances: Application on RFID circuits

✍ Scribed by Aziza, H.; Bergeret, E.; Perez, A.; Portal, J-M.

Book ID: 125500827
Publisher: IEEE
Year: 2007
Weight: 523 KB
Category: Article
ISBN: 1424412773
DOI: 10.1109/DTIS.2007.4449502

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