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[IEEE 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Rabat, Morocco (2007.09.2-2007.09.5)] 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - A study on defect tolerance of tiles implementing universal gate functions

✍ Scribed by Sen, Bibhash; Sikdar, Biplab K.

Book ID: 118230627
Publisher: IEEE
Year: 2007
Weight: 490 KB
Volume: 0
Category: Article
ISBN: 1424412773
DOI: 10.1109/dtis.2007.4449484

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