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[IEEE 2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics - Hualien, Taiwan (2007.08.12-2007.07.16)] 2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics - Forward-Imaging Swept Source Optical Coherence Tomography using Silicon MEMS Scanner for High-Speed 3-D Volumetric Imaging

✍ Scribed by Kumar, Karthik; Condit, Jonathan C.; McElroy, Austin; Kemp, Nate J.; Hoshino, Kazunori; Milner, Thomas E.; Zhang, Xiaojing

Book ID: 120275331
Publisher: IEEE
Year: 2007
Weight: 575 KB
Category: Article
ISBN: 1424406412
DOI: 10.1109/OMEMS.2007.4373814

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