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[IEEE 2007 IEEE International High Level Design Validation and Test Workshop - Irvine, CA, USA (2007.11.7-2007.11.9)] 2007 IEEE International High Level Design Validation and Test Workshop - Validating the dependability of embedded systems through fault injection by means of loadable kernel modules

✍ Scribed by Murciano, Marco; Violante, Massimo

Book ID: 126655208
Publisher: IEEE
Year: 2007
Weight: 212 KB
Category: Article
ISBN: 1424414806
DOI: 10.1109/HLDVT.2007.4392811

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