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[IEEE 2007 IEEE International High Level Design Validation and Test Workshop - Irvine, CA, USA (2007.11.7-2007.11.9)] 2007 IEEE International High Level Design Validation and Test Workshop - Functional coverage measurements and results in post-Silicon validation of Core™2 duo family

✍ Scribed by Bojan, Tommy; Aguilar Arreola, Manuel; Shlomo, Eran; Shachar, Tal

Book ID: 120053103
Publisher: IEEE
Year: 2007
Weight: 265 KB
Category: Article
ISBN: 1424414806
DOI: 10.1109/HLDVT.2007.4392804

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