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[IEEE 2007 9th European Conference on Radiation and Its Effects on Components and Systems (RADECS 2007) - Deauville, France (2007.09.10-2007.09.14)] 2007 9th European Conference on Radiation and Its Effects on Components and Systems - Effects of guard bands and well contacts in mitigating long SETs in advanced CMOS processes

✍ Scribed by Narasimham, Balaji; Bhuva, Bharat L.; Schrimpf, Ronald D.; Massengill, Lloyd W.; Gadlage, Matthew J.; Timothy Holman, W.; Witulski, Arthur F.; Robinson, William H.; Black, Jeffrey D.; Benedetto, Joseph M.; Eaton, Paul H.

Book ID: 126592987
Publisher: IEEE
Year: 2007
Weight: 599 KB
Category: Article
ISBN: 142441704X
DOI: 10.1109/RADECS.2007.5205574

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