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[IEEE 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems - Ciechocinek, Poland (2007.06.21-2007.06.23)] 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems - Investigation of Substrate Noise Coupling and Isolation Characteristics for a 0.35UM HV CMOS Technology

✍ Scribed by Pflanzl, W.C.; Seebacher, E.

Book ID: 118162505
Publisher: IEEE
Year: 2007
Weight: 387 KB
Volume: 0
Category: Article
ISBN-13: 9788392263296
DOI: 10.1109/mixdes.2007.4286198

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