𝔖 Bobbio Scriptorium

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[IEEE 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems - Ciechocinek, Poland (2007.06.21-2007.06.23)] 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems - EKV3 Parameter Extraction and Characterization of 90nm RF-CMOS Technology

✍ Scribed by Yoshitomi, S.; Bazigos, A.; Bucher, M.

Book ID: 115452305
Publisher: IEEE
Year: 2007
Weight: 886 KB
Volume: 0
Category: Article
ISBN-13: 9788392263296
DOI: 10.1109/mixdes.2007.4286123

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