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[IEEE 2006 International Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits - Aveiro, Portugal (2006.01.30-2006.01.31)] 2006 International Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits - GaN HEMT Technology Development Assessment through Nonlinear Characterization

✍ Scribed by Camarchia, V.; Guerrieri, S.; Pirola, M.; Teppati, V.; Ghione, G.

Book ID: 126754075
Publisher: IEEE
Year: 2006
Weight: 226 KB
Category: Article
ISBN-13: 9780780397231
DOI: 10.1109/INMMIC.2006.283510

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