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[IEEE 2010 Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits - Gothenburg, Sweden (2010.04.26-2010.04.27)] 2010 Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits - Temperature dependent memory effects on a drain modulated GaN HEMT power amplifier

✍ Scribed by Marante, R.; Cabria, L.; Cabral, P.; Pedro, J. C.; Garcia, J. A.

Book ID: 125523134
Publisher: IEEE
Year: 2010
Weight: 553 KB
Category: Article
ISBN: 1424474108
DOI: 10.1109/INMMIC.2010.5480133

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