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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Reliability Model of Bandgap Engineered SONOS (BE-SONOS)

✍ Scribed by Lue, Hang-Ting; Wang, Szu-Yu; Hsiao, Yi-Hsuan; Lai, Erh-Kun; Yang, Ling-Wu; Yang, Tahone; Chen, Kuang-Chao; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih Yuan

Book ID: 124165110
Publisher: IEEE
Year: 2006
Weight: 297 KB
Category: Article
ISBN-13: 9781424404384
DOI: 10.1109/IEDM.2006.346822

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