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[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Future of Strained Si/Semiconductors in Nanoscale MOSFETs

โœ Scribed by Thompson, S. E.; Suthram, S.; Sun, Y.; Sun, G.; Parthasarathy, S.; Chu, M.; Nishida, T.


Book ID
118264005
Publisher
IEEE
Year
2006
Weight
405 KB
Volume
0
Category
Article
ISBN-13
9781424404384

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