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[IEEE 2006 IEEE International Symposium on the Applications of Ferroelectrics - Sunset Beach, NC, USA (2006.07.30-2006.08.3)] 2006 IEEE International Symposium on the Applications of Ferroelectrics - High Reliability Thin Layer BME X7R Dielectric with Only Few Core-Shell Grains

✍ Scribed by Xu, Xilin; Pinceloup, Pascal; Gurav, Abhijit; Randall, Mike; Tajuddin, Aziz; Yang, Gai-Ying

Book ID: 126605096
Publisher: IEEE
Year: 2006
Weight: 784 KB
Category: Article
ISBN: 142441332X
DOI: 10.1109/ISAF.2006.4387822

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