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[IEEE 2006 IEEE International Symposium on the Applications of Ferroelectrics - Sunset Beach, NC, USA (2006.07.30-2006.08.3)] 2006 IEEE International Symposium on the Applications of Ferroelectrics - Embedded FeRAM Challenges in the 65-nm Technology Node and Beyond

✍ Scribed by Kato, Yoshihisa; Tanaka, Hiroyuki; Isogai, Kazunori; Kaibara, Kazuhiro; Kaneko, Yukihiro; Shimada, Yasuhiro; Brubaker, Matt; Celinska, Jolanta; McMillan, Larry D.; de Araujo, Carlos A. Paz

Book ID: 121466659
Publisher: IEEE
Year: 2006
Weight: 824 KB
Category: Article
ISBN: 142441332X
DOI: 10.1109/ISAF.2006.4349291

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