[IEEE 2006 Asia-Pacific Microwave Conference - Yokohama, Japan (2006.12.12-2006.12.15)] 2006 Asia-Pacific Microwave Conference - A new implemenation for RF SiCMOS transistor model using SDD for quantifying individual contribution to distortion from transistor’s nonlinear parameters

✍ Scribed by Abuelmaatti, Ali; Thayne, Iain; McGregor, Ian; Wasige, Edward

• Book ID: 121831435
• Publisher: IEEE
• Year: 2006
• Weight: 101 KB
• Category: Article
• ISBN: 4902339110
• DOI: 10.1109/APMC.2006.4429474