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[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Endurance Characteristics of SuperFlash� Memory

✍ Scribed by Liu, Xian; Markov, Viktor; Kotov, Alexander; Dang, Tho; Levi, Amitay; Yue, Ian; Wang, Andy; Qian, Rodger

Book ID: 127076241
Publisher: IEEE
Year: 2006
Weight: 118 KB
Category: Article
ISBN-13: 9781424401604
DOI: 10.1109/icsict.2006.306479

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