[IEEE 2005 International Conference On Simulation of Semiconductor Processes and Devices - Tokyo, Japan (2005.09.3-2005.09.3)] 2005 International Conference On Simulation of Semiconductor Processes and Devices - Monte-Carlo Simulations of Performance Scaling in Strained-Si nMOSFETs

✍ Scribed by Kumar, A.; Fischetti, M.V.; Laux, S.E.

• Book ID: 120606863
• Publisher: IEEE
• Year: 2005
• Tongue: Japanese
• Weight: 587 KB
• Category: Article
• ISBN-13: 9784990276201
• DOI: 10.1109/SISPAD.2005.201532