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[IEEE 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - Taipei, Taiwan (03-05 Aug. 2005)] 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - An Investigation into Three-Level Ferroelectric Memory

✍ Scribed by Raiter, K.R.; Cockburn, B.F.

Book ID: 126974854
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 209 KB
Category: Article
ISBN-13: 9780769523132
DOI: 10.1109/mtdt.2005.17

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