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[IEEE 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - Taipei, Taiwan (03-05 Aug. 2005)] 2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05) - FSM-Based Programmable Memory BIST with Macro Command

✍ Scribed by Po-Chang Tsai, ; Sying-Jyan Wang, ; Feng-Ming Chang,

Book ID: 121182727
Publisher: IEEE
Year: 2005
Weight: 363 KB
Category: Article
ISBN-13: 9780769523132
DOI: 10.1109/MTDT.2005.24

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