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[IEEE 2005 IEEE International Frequency Control Symposium and Exposition, 2005. - Vancouver, BC, Canada (Aug. 29-31, 2005)] Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. - On the power dependence of extraneous microwave fields in atomic frequency standards

✍ Scribed by Jefferts, S.R.; Shirley, J.H.; Ashby, N.; Heavner, T.P.; Donley, E.A.; Levi, F.

Book ID: 126761525
Publisher: IEEE
Year: 2005
Weight: 296 KB
Category: Article
ISBN-13: 9780780390539
DOI: 10.1109/FREQ.2005.1573910

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