𝔖 Bobbio Scriptorium

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[IEEE 2005 IEEE International Frequency Control Symposium and Exposition, 2005. - Vancouver, BC, Canada (Aug. 29-31, 2005)] Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005. - Stress induced performance degradation in LC oscillators

✍ Scribed by Enjun Xiao, ; Ghosh, P.P.

Book ID: 126596759
Publisher: IEEE
Year: 2005
Weight: 278 KB
Category: Article
ISBN-13: 9780780390539
DOI: 10.1109/FREQ.2005.1573993

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