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[IEEE 2004 International Conference on the Business of Electronic Product Reliability and Liability - Shanghai, China (27-30 April 2004)] Proceedings of 2004 International Conference on the Business of Electronic Product Reliability and Liability (IEEE Cat. No.04EX809) - Study for safe operating area of high voltage LDMOS

โœ Scribed by Fang Jian, ; Li Zhaoji, ; Zhang Bo,


Book ID
121284332
Publisher
IEEE
Year
2004
Weight
361 KB
Category
Article
ISBN-13
9780780383616

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