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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest - Fort Worth, TX, USA (6-11 June 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Thermal resistance calculation of AlGaN/GaN on SiC devices

✍ Scribed by Darwish, A.M.; Bayba, A.; Hung, H.A.

Book ID: 111958847
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 355 KB
Volume: 0
Category: Article
ISBN-13: 9780780383319
DOI: 10.1109/mwsym.2004.1339014

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