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[IEEE 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Forth Worth, TX, USA (June 6-11, 2004)] 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535) - Numerical noise model for the AlGaN/GaN HEMT

✍ Scribed by Sungjae Lee, ; Webb, K.J.

Book ID: 115508777
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 262 KB
Volume: 2
Category: Article
ISBN-13: 9780780383319
DOI: 10.1109/mwsym.2004.1339166

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