[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - Correlation between Stress-Induced Leakage Current (SILC) and the HfO/sub 2/ bulk trap density in a SiO/sub 2//HfO/sub 2/ stack

✍ Scribed by Crupi, F.; Degraeve, R.; Kerber, A.; Kwak, D.H.; Groeseneken, G.

• Book ID: 120157316
• Publisher: IEEE
• Year: 2004
• Weight: 412 KB
• Category: Article
• ISBN-13: 9780780383159
• DOI: 10.1109/RELPHY.2004.1315321