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[IEEE 2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) - Newport Beach, CA, USA (2003.10.2-2003.10.2)] 2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) - Effect of nano-scale strained Si grown on SiGe-on-insulator on electron mobility

✍ Scribed by Park, ; Shim, ; Lee, ; Park, ; Moon, ; Maeng, ; Cho, ; Yoo,

Book ID: 126674528
Publisher: IEEE
Year: 2003
Weight: 133 KB
Category: Article
ISBN-13: 9780780378155
DOI: 10.1109/SOI.2003.1242898

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