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[IEEE 2003 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong, China (16-18 Dec. 2003)] 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668) - A new multi-port memorizer with global share and feebleness conflict access

✍ Scribed by Fan, Z.M.; Liu, D.; Tong, L.; Zhang, H.; Wang, W.S.

Book ID: 118167786
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 212 KB
Volume: 0
Category: Article
ISBN-13: 9780780377493
DOI: 10.1109/edssc.2003.1283484

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