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[IEEE 2003 IEEE Conference on Electron Devices and Solid-State Circuits - Hong Kong, China (16-18 Dec. 2003)] 2003 IEEE Conference on Electron Devices and Solid-State Circuits (IEEE Cat. No.03TH8668) - A new EST with dual trench gate electrode (DTG-EST)

✍ Scribed by Dae Won Kim, ; Dae Jong Kim, ; Ey Goo Kang, ; Man Young Sung, ; Dong Hee Rhie,

Book ID: 111863072
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 202 KB
Volume: 0
Category: Article
ISBN-13: 9780780377493
DOI: 10.1109/edssc.2003.1283558

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