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[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Crystal-based spin analyzer for fast neutron beams

✍ Scribed by Bondarenco, N.; Shul'ga, N.

Book ID: 126677617
Publisher: IEEE
Year: 2003
Weight: 169 KB
Volume: 5
Category: Article
ISBN-13: 9780780377387
DOI: 10.1109/PAC.2003.1289904

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