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[IEEE 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Portland, OR, USA (May 12-16, 2003)] Proceedings of the 2003 Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) - Bunch length measurements at Bessy

✍ Scribed by Abo-Bakr, M.; Anders, W.; Kuske, P.; Wustefeld, G.

Book ID: 126689907
Publisher: IEEE
Year: 2003
Weight: 206 KB
Volume: 5
Category: Article
ISBN-13: 9780780377387
DOI: 10.1109/PAC.2003.1289800

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