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[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Excess hot-carrier currents in SOI MOSFETs and its implications

✍ Scribed by Pin Su, ; Ken-ichi Goto, ; Sugii, T.; Chenming Hu,

Book ID: 126642448
Publisher: IEEE
Year: 2002
Weight: 287 KB
Category: Article
ISBN-13: 9780780373525
DOI: 10.1109/RELPHY.2002.996615

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