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[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Physical mechanisms of performance instabilities such as gate-lag and kink phenomena in GaAs MESFETs

✍ Scribed by Mitani, Y.; Wakabayashi, A.; Horio, K.

Book ID: 111657881
Publisher: IEEE
Year: 2002
Weight: 342 KB
Volume: 0
Category: Article
ISBN-13: 9780780373525
DOI: 10.1109/relphy.2002.996634

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