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[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Increased cell killing and DNA damage in cells exposed to ultra-short pulsed electric fields

✍ Scribed by Stacey, M.; Stickley, J.; Fox, P.; O'Donnell, C.; Schoenbach, K.; Beebe, S.; Buescher, S.

Book ID: 120279521
Publisher: IEEE
Year: 2002
Weight: 237 KB
Category: Article
ISBN-13: 9780780375024
DOI: 10.1109/CEIDP.2002.1048741

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