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[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Towards an understanding of nanometric dielectrics

✍ Scribed by Nelson, J.K.; Fothergill, J.C.; Dissado, L.A.; Peasgood, W.

Book ID: 120206637
Publisher: IEEE
Year: 2002
Weight: 286 KB
Category: Article
ISBN-13: 9780780375024
DOI: 10.1109/CEIDP.2002.1048793

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