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[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Weibull statistical analysis of area effect on the breakdown strength in polymer films

โœ Scribed by Ul-Haq, S.; Raju, G.R.G.


Book ID
120234147
Publisher
IEEE
Year
2002
Weight
274 KB
Category
Article
ISBN-13
9780780375024

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