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[IEEE 2002 Conference on Optoelectronic and Microelectron Materials and Devices - Sydney, NSW, Australia (11-13 Dec. 2002)] 2002 Conference on Optoelectronic and Microelectronic Materials and Devices. COMMAD 2002. Proceedings (Cat. No.02EX601) - Minority carrier lifetime measurement in GaN by a differential phase technique

โœ Scribed by Tan, W.; Spaargaren, S.M.R.; Parish, G.; Nener, B.D.; Mishra, U.K.


Book ID
121738321
Publisher
IEEE
Year
2002
Weight
194 KB
Category
Article
ISBN-13
9780780375710

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