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[IEEE 2002 Annual Reliability and Maintainability Symposium (RAMS) - Seattle, WA, USA (28-31 Jan. 2002)] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) - Reliability stress test method: impact on the new product introduction process, time to market, field reliability impact and reliability assessment

✍ Scribed by Jawaid, S.; Ferguson, J.; Zaki, S.

Book ID: 126642445
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 550 KB
Category: Article
ISBN-13: 9780780373488
DOI: 10.1109/RAMS.2002.981663

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