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[IEEE 2002 Annual Reliability and Maintainability Symposium (RAMS) - Seattle, WA, USA (28-31 Jan. 2002)] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) - Dynamic modeling of degradation data

✍ Scribed by Mingxiao Jiang, ; Yongcang Zhang,

Book ID: 115493688
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 361 KB
Volume: 0
Category: Article
ISBN-13: 9780780373488
DOI: 10.1109/rams.2002.981709

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