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[IEEE 2002 2nd IEEE Conference on Nanotechnology - Washington, DC, USA (26-28 Aug. 2002)] Proceedings of the 2nd IEEE Conference on Nanotechnology - Imaging properties of a metamaterial superlens

✍ Scribed by Fang, N.; Xiang Zhang,

Book ID: 120652111
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 239 KB
Category: Article
ISBN-13: 9780780375383
DOI: 10.1109/NANO.2002.1032233

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