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[IEEE 2002 2nd IEEE Conference on Nanotechnology - Washington, DC, USA (26-28 Aug. 2002)] Proceedings of the 2nd IEEE Conference on Nanotechnology - Calculating magnetic susceptibility over multiple length scales

✍ Scribed by Harter, A.W.; Mohler, G.; Moore, R.L.; Schultz, J.W.

Book ID: 115458451
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 298 KB
Volume: 0
Category: Article
ISBN-13: 9780780375383
DOI: 10.1109/nano.2002.1032297

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